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By J.W. Edington

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Extra resources for Electron Diffraction in the Electron Microscope

Sample text

2 Spot patterns-identity ofmaterial unknown (1) Obtain a number of patterns using different B parallel to simple zone axes, that is simple patterns with a high spot density. 3. (2) Measure all distances of spots from centre and check common types of reflection. 2. 1. (5) Progress through remaining patterns until all are completely self-consistent, both in terms of indexing and applied angle of tilt to move from one B to another. 2. 1, (1)-(4), using the Kikuchi line pair spacing instead of spot spacing.

4(b), even when only the spots are used. Clearly this method is to be preferred. 2. 1 Consideration offurther sources of error in determining B Such factors as spherical aberration, errors in lattice parameter or electron wavelength, errors in measurement of the SADP (provided reasonable care is taken to measure an enlarged print) do not significantly influence the accuracy of the methods discussed in sections 2. 2, 2. 3. However they may be important if higher accuracy is required, see Pumphrey and Bowkett (1970b).

2). 1(b)) . This is equivalent to determining in which unit triangle B lies using a Kikuchi map. 22 B lies between [126] and [1 I3]. , 1964; Vaughan and Silcock, 1967). The procedure is as follows. c. c. materials. (2) Tilt a known amount in a known direction until a simple recognisable diffraction pattern is 29 Electron Diffraction in the Electron Microscope d irection of motion of K1kuch1 lmes ~ tilt (ol 420 o~is (b) 420 331 iii· . • Il l 331 420 Ill • • • iTI L 420 331 B ri23J (c) ro 331 8 11231 (d) ri23J 9" cm 1 c tilt _ ulnC tiu .

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